Instrumentation and USIC

Results of Ph.d Entrance Examination

List of candidates who have qualified in the Ph.d Entrance Examination

Departmental Profile

Department of Instrumentation & USIC originally started as USIC, GU in 1978 under USIC scheme of UGC in the department of the Physics, GU and became a full-fledged department in 1986. As academic department it started post graduate diploma in instrumentation (pgdi) course, first university in north eastern region to start instrumentation course. at the beginning studens with be background and m.sCwere admitted. most students with pgdI DIPLOMA WERE THEN ABSORBED IN VARIOUS INDUSTRIES LIKE OIL INDIA LIMITED, REFINARIES OF THE REGION, PAPER MILL Etc.Two year Four Semester MSc Course in Instrumentation has been introduced since 2005. The intake capacity was 15 and minimum eligibility for admission is BSc with Physics and Mathematics. erom 2013 the intake capacity has been increased to 18. The admission ismade through an Entrance Examination.glass blowing workshop.

In addition to academic department a mechanical workshop and glass blowing workshop IS ATTACHED with the department under usic provision.glass blowing workshop is giving servicenot only to this university but also other academic INSTITUTIONS LIKE iitg, tezpur university and other colleges of the region.

Siphisticated analytical instrument facilities (saif)Guwahati, sponsored by the Department of Science and Technology (DST), Govt. of India was set up at this Department, Gauhati University in 1986at the beginning of the Seventh Plan as a National X-ray Facility with a view to extending modern sophisticated analytical facility to scientific community and to cultivate instrumentation culture.

Students

M.Sc. Regular students : 15 (Fifteen) per batch.

Mission and Objectives

Teaching in instrumentation.
Research in various fields of instrumentation.

Introduction & History

Department of Instrumentation & USIC originally started as University Science Instrumentation Centre (USIC), GU in 1978 under USIC scheme of University Grants Commission (UGC) in the department of Physics, GU.

Activities

Teaching Programme

Two year Four Semester MSc Course in Instrumentation has been introduced since 2005. The intake capacity is 15 and minimum eligibility for admission is BSc with Physics and Mathematics. The admission is through an Entrance Examination.

Facilities & Assets

Mechanical Workshop

Welding shop
Machine shop

Structure

SECTIONSACADEMICUSICSAIF
ACTIVITY M.Sc., Ph.d
R & D
Repair & Maintenance
Design & Fabrication
Analytical Services
R & D

Members of Departmental Advisory Committee (DAC)

Prof. K.C. Sarma, HOD & Chairman
Prof. P.H. Talukdar

Heads of the Department ( HOD )

Prof. I. M. Das, Founder Head ( 1978 – 1995)
Prof. G. K. D. Mazumdar ( 1995 – 1998)

Important Dates

Year of Establishment : 1978.
Inauguration of Building : 13th August 1988.


About

Mission and Objectives

  • Teaching in instrumentation.
  • Research in various fields of instrumentation.
  • Generation of skilled manpower in instrumentation
  • Design and fabrication of instrument required for teaching and research.
  • To provide services in repair and maintenance of instrument
  • To provide analytical services in specialized instruments.
  • To impart quality education in instrumentation in MSc level
  • To do quality research in various fields of instrumentation.
  • To nurture and spread the culture of modern instrumentation.

Introduction & History

Department of Instrumentation & USIC originally started as University Science Instrumentation Centre (USIC), GU in 1978 under USIC scheme of University Grants Commission (UGC) in the department of Physics, GU. It became a full-fledged department in 1986. The main building of the department was constructed with grants from UGC and was inaugurated by the then Hon’ble Chancellor of GU Sri Bhisma Narayan Singh on 13th August 1988. The department was recognized as an academic department in 1987 by the Academic Council, GU.

The Post graduate Diploma in Instrumentation (PGDI) course was started in 1987-88 and was the first such course in the entire N.E region which trained qualified engineers and scientists to gain experience in the field of instrumentation. Seventy Five (75) students have passed out PGDI and many of the PGDI passed students are employed in the industries like Oil India Limited (OIL), Gauhati Refinery, Numiligar Refinery etc. The Department has produced 6 ( six ) PhDs so far and 29 ( twenty nine) Research Scholars are undertaking research under PhD Programme.

The department through it’s repair and maintenance wing has been rendering services in the field of operation, repair and maintenance of various instruments not only to the departments of this university but also to affiliated colleges and other public and private organizations of the NE region. The center has also successfully completed a number of training programs on repair and maintenance of scientific equipment, glass blowing and use of mechanical workshop equipment

A large number of jobs have been done by the repair and maintenance wing of the department and there by has saved considerable amount of GU exchequer. A considerable amount has been earned from outside institutions by rendering repair and maintenance services. Some of the outside institutions that have availed of repair and maintenance services of the department in past are Handique Girls College, B Barooah College, Forensic Science Lab, Assam and Meghalaya, NERIST, Royal Bhutan Polytechnic, Sherbutse College, Bhutan, Statefed Tripti Vanaspati Plant, Gauhati Medical College & Hospital, Assam Engineering College, Indian Institute of Technology, Guwahati etc. The department has been rendering training to persons deputed from outside institutions from time to time. Trainees deputed from NEHU & IASST were trained in the department and revenue has been earned through such training. The department has organised workshops, seminars etc. from time to time. A two weeks training Programme in Electronics and Instrumentation was organised in 1988-89. Another workshop on “Repair and maintenance of laboratory instruments” for college teachers was organised in 1992. The department hosted the National Symposium on Instrumentation ( NSI-17) in 1992.

Sophisticated Analytical Instrument Facility ( SAIF), sponsored by Department of Science and Technology, Govt. of India was established in 1986 as a Regional X-ray Facility in the department to cater the need of scientific community from research, academic and industrial organizations. SAIF is rendering analytical services in the field of X-ray Diffractometry(XRD) and X-ray Fluoroscence Spectrometry(XRF) and has earned an amount of more than Rs. 7.59 lakhs by rendering analytical services till date. SAIF has been regularly participating in the rounds of International Proficiency Test for Analytical Geochemical Laboratories conducted by International Association of Geoanalysts(IAG) and has so far organized three Regional workshops on ‘X-ray Diffraction and X-ray Fluorescence : Procedures and Applications’.

The name of the department was changed to ‘Department of Instrumentation & USIC’ in 2005 and MSc in Instrumentation course was introduced with effect from 2004-2005.

Activities


Teaching

TwoYear Four Semester MSc Course in Instrumentation has been introduced since 2005. Earlier a One Year Two Semesters Post Graduate Diploma in Instrumentation (PGDI) course introduced in 1987-88 was conducted.

Research

Interdepartmental interdisciplinary research programmes are undertaken by the faculty members of the department.

Repair and Maintenance

Since its inception, the department has been providing repair and maintenance services to various departments of GU, colleges and other institutions. From time to time the department has been organising training programmes, workshops, seminars etc on subjects related to repair and maintenance of instruments.

Analytical Services

A Regional X-ray facility called Sophisticated Analytical Instrument Facility (SAIF), sponsored by the Department of Science and Technology, Govt. of India at the department was established in the department in 1987 and SAIF is presently equipped with two X-ray Diffractometers(XRD), two X-ray Fluorescence Spectrometers(XRF) and sample preparation accessories. Since establishment SAIF is providing analytical services by analyzing samples in XRD and XRD received from users from various academic, research and industrial organizations and thereby SAIF has earned more then Rs.8 Lakhs till date.

Facilities and Assets


  • Electronics Laboratory
  • Computer Laboratory
  • Instrumentation Laboratory
  • Microprocessor/Microcontroller Laboratory
  • Process Control Laboratory
  • Electronic Workshop
  • Mechanical Workshop-
    • Welding shop
    • Machine shop
    • Carpentry shop
  • Glass Blowing Workshop
  • Sophisticated Analytical Instrument Facility
    • X-ray Diffractometer ( XRD )
    • X-ray Fluorescence Spectrometer ( XRF )
    • Pulveriser
    • Sample Preparation Laboratory
  • Departmental Library

Structure

SECTIONSACADEMICUSICSAIF
ACTIVITY M.Sc., Ph.d
R & D
Short Term Courses
Workshop, Seminar
Repair & Maintenance
Design & Fabrication
Short Term Courses
Workshop, Seminar
Analytical Services
R & D
Workshop, Seminar
MANPOWER

DAC & DRC


Members of Departmental Advisory Committee (DAC)

  • Prof. K.C. Sarma, HOD & Chairman
  • Prof. P.H. talukdar
  • Mr. Utpal Sarma
  • Prof. P. K. Baruah ( Special invitee )
  • Prof. G. K. D. Mazumdar (Special invitee)
  • D Das (Special Invitee)
  • B Rajbangshi (Special Invitee)
  • Dr. S. karmakar (Special Invitee)
  • Dr. S. Bardaloi (Special Invitee)
  • Meetings of DAC : One DAC meeting is generally held once a month.

      Members of Departmental Research Committee ( DRC )

      • Prof. K.C.Sarma
      • Prof. P.H.Talukdar
      • Mr. Utpal Sarma
      • Prof. (Mrs.) P. Datta, HOD Electronic Sciuences
      • Prof. B. K. Sarma, Physics
      • Prof. H. L. Das
      • Meetings of DRC : DRC meeting is generally held in January / February and some special meeting are also held. PhD Admission, Recognition of Ph. D. Guide, Progress Report of Research etc are under purview of DRC.

Heads of the Department ( HOD )

  • Prof. I. M. Das , Founder Head ( 1978 – 1995)
  • Prof. G. K. D. Mazumdar ( 1995 – 1998)
  • Prof. P. K. Baruah ( 1998 – 1999)
  • Prof. G. K. D. Mazumdar ( 1999 – 2005)
  • Prof. P.K. Boruah (2005 - 2007)
  • Prof. K.C. Sarma (2007 - till date )

Important Dates

  • Year of Establishment : 1978
  • Inauguration of Building : 13th August1988
  • Establishment of SAIF : 1986
  • Recognition as Academic Department : 1987
  • Introduction of PGDI Course : 1987-88
  • Introduction of MSc Instrumentation Course : 2004-05
  • First PhD Produced : 1994
  • Hoisting of NSI-17 : 1992

Course and Programmes


Postgraduate Course

Semester-wise distribution of marks:

First Semester = 550 (33 credits)
Second Semester = 550 (33 credits)
Third Semester = 550 (33 credits)
Fourth Semester = 550 (33 credits)
Total marks = 2200 (132 credits)
Optical and Optoelectronic Instrumentation
Communication Techniques
Embedded System – I
Modelling and Simulation
X-ray Diffractometry and X-ray Fluorescence Spectometry and Application
Fourth Semester
Biomedical Instrumentation
Computer Networks
Embedded System – II

Research

Major areas of Research-

  • Smart Transducer Instrumentation.
  • Experimental Cosmic Ray Physics.
  • Design of Optoelectronic System for Semiconductor device characterization.
  • Synthesis and characterization of nano-crystalline thin films by chemical bath deposition.
  • Computer Networking.
  • Speech Analysis and Synthesis.
  • Ionospheric Studies.
  • Laser based Instrumentation.
  • X-ray Crystallography.

Guides

Serial no.NameE-mail
1.Prof. K.C. Sarmakcsarma@gauhati.ac.in
2.Prof. P.H. Talukdarphtalukdar@gauhati.ac.in
3.Prof. G.K.D. Mazumdargkdmazumdar@gauhati.ac.in
4.Prof. P.K. Boruahpkboruah@gauhati.ac.in
5.Dr. S. Karmakarskarmakar@gauhati.ac.in
6.Dr. S. Bardaloisbardaloi@gauhati.ac.in

Contact

D Das
Technical Officer
Department of Instrumentation and USIC
Gauhati University
Guwahati- 781 014
Assam, INDIA

Phone No: +91-361-2570560 (Office)


Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

History and Introduction

Sophisticated Analytical Instrument Facility ( SAIF ), Guwahati, sponsored by the Department of Science and Technology ( DST ), Govt. of India was set up at Department of Instrumentation and USIC, Gauhati University in 1986 at the beginning of the Seventh Plan as a National X-ray Facility with a view to extending moderns sophisticated analytical facility to scientific community and to cultivate instrumentation culture. At the time of establishment the facility was known as Sophisticated Instrument Facility ( SIF ) and Department of Instrumentation & USIC, Gauhati University was known as University Science Instrumentation Centre ( USIC ), Gauhati University.

Sophisticated Analytical Instrument Facility ( SAIF ) is a programme initiated by Department of Science & Technology, Govt. of India to provide facilities of sophisticated analytical instruments to researchers so that the non-availability of these instruments in their institutes may not come in the way of scientists in pursuing R&D activities requiring such facilities and researchers are able to keep pace with developments taking place globally. Thirteen Sophisticated Analytical Instrument Facilities (SAIFs) which provide sophisticated analytical instruments to users are functioning in various locations in the country and SAIF, Guwahati, located at Department of Instrumentation & USIC, Gauhati University is one of them.

SAIF, Guwahati is a facility comprised of sophisticated X-ray machines. It is open to all kinds of users from all over the country. Basic aim of SAIF is to cater the need of scientific community from research, academic and industrial organization.

The facility is at present is equipped with an X’pert Pro Automated Powder X-ray Diffractometer, Two Sequential X-ray Fluorescence Spectrometers with related accessories and sample preparation equipment.

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

Mission and Objectives

Missions and objectives of Sophisticated Analytical Instrument Facility ( SAIF ), Guwahati are:

  • To provide analytical services
  • To assist and support researchers in keeping pace with research and development taking place globally
  • To carry out analysis of samples received from the scientists/institutes
  • To provide facilities of sophisticated analytical instruments to scientists and other users from academic institutes, R&D laboratories and industries to enable them to carry out R&D work
  • To acquire and develop capability for preventive maintenance and repair of sophisticated instruments.
  • To organize short Term Courses / workshops on the use and application of various instruments and analytical techniques
  • To train technicians for maintenance and operation of sophisticated instruments
  • To undertake design and development of instruments / accessories of existing instruments

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)

The Facilities available in SAIF Guwahati are

Automated Powder X-ray Diffractometer ( XRD )
Sequential X-ray Fluorescence Spectrometer ( XRF )
Single Crystal X-ray Diffractometer (SCD)
Sample Preparation Laboratory
Licensed Softwares

  • SuperQ (for XRF)
  • Pro Trace (for XRF)
  • JCPDS Database PDF1 and PDF2
  • ICSD software

Accessories

  • Pulveriser
  • Precision Electronic Balance
  • Pressed Pallet making facility
  • Fused Bead making facility
  • Muffle Furnace
  • Stereo zoom microscope
  • Standard Reference Material
    • Silicate Rocks
    • Cements
    • Limestone
  • 5 KVA Diesel Generator

1) X-ray Powder Diffractometer (XRD)

An Automated Powder X-ray Diffractometer ( XRD ) of Model APD 1700, Make Philips was installed in the year 1987 which after fifteen years of operation has become obsolete.

A fully Automated Computerised Powder X-ray Diffractometer ( XRD ) Model X’Pert Pro, Make PANalytical has been installed 2002 and is working.

The detailed specification are: Model : X’Pert Pro
Make : Philips ( Now PANalytical )
X-ray Tube : Cu
Angular Range ( 2θ ) : 1o to 167o
Programmable Divergence Slit
Programmable fixed slit with ¼ o, ½ o, 1o, 2o, 4o
High Temperature Attachment of range up to 1600o C
Thin Film Attachment
X’Pert software

  • Organiser
  • Data Collecter
  • Graphics & Identity
  • Stress and WinGIXA

ICDD database with PDF-1 & PDF2
ICSD Software

XRD analysis of solid samples are routinely done in SAIF Guwahati..

Solid sample in the form of dry powder of about 300 mesh about 3 gm or sample on glass slide of size 2cm X 3.5cm and thickness 0.2 cm with uniform sample layer of size 2cm X 1.5cm on one side is required. XRD with less amount of sample or of users specific sample is also possible in special cases.

The output consists of Diffractogram, Peak positions, d values & relative intensities, Integrated Intensities, Peak Area & FWHM. Other analysis capabilities/services are:

  • Phase Identification
  • Quantitative analysis of minerals present in the ICSD data base using X’Pert Plus software
  • Grazing incidence X-ray analysis of thin films
  • Partilce size measurement
  • Reflectivity measurement and film thickness analysis ( under development )
  • Microstrain and Stress analysis ( under development )
  • High Temperature ( upto 1600oC ) analysis of powder samples

2) X-ray Fluorescence Spectrometer (XRF)

SAIF Guwahati is equipped with XRF. It was installed in 2005. The detailed specifications are:
Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installed in 2005
Model : AXIOS
Make : PANalytical
X-ray Tube : Rh
Elemental Range : Oxygen to Uranium
Analysing Crystal : LiF200, LiF220, GE, PE,PX1
Detectors : Flow proportional counter & scintillation
Software : SuperQ Software for qualitative and quantitative analysis
Pro Trace Software for trace element analysis
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the XRF.

Sample in the form of dry powder about 200 mesh, about 10gm is required for estimation of major and minor element oxides and qualitative analysis. Qualitative analysis may be possible with less amount of sample in some cases and in case of non-powder the sample should be in suitable form. For analysis of traces 20gm sample is required.

  • Qualitative Analysis
  • Quantitative Analysis

Qualitative Analysis : Qualitative elemental analysis are done for detection of elements present in the sample.

  • Detectable elemental range is from oxygen to uranium
  • Lower limit of detection (LLD) varies from element to element
  • Lower Limit of Detection (LLD) also depends upon nature and compositional matrix of the sample

Quantitative Analysis : Quantitative analysis of following types of samples are done

  • Silicate Rocks
  • Cement
  • Limestone

Quantitative analysis of silicate rocks for 10 major element oxides SiO2, Al2O3, Fe2O3(T), MnO, MgO, Na2O, CaO, K2O, TiO2, P2O5 and 32 Trace Elements Ag, As, Ba, Br, Cd, Ce, Co, Cr, Cs, Cu, Ga, La, Mn, Nb, Nd, Ni, Mo, Pb, Rb, S, Sb, Sc, Sn, Sm, Sr, Th, Tl, U, V, Y, Zn, Zr are being done on routine basis.

XRF Lab of SAIF, Gauhati University is a regular Participant of GeoPT held two times in a year

International Proficiency Test for Analytical Geochemistry Laboratories (GeoPT)
conducted by
Dept. of Earth Sciences,
The Open University,
Walton Hall,Milton, Keynes,
Mk7 6AA,
United Kingdom

Since 2000, XRF Lab. of SAIF, Guwahati, Dept. of Instrumentation & USIC GU, is regularly participating in the International Proficiency Test for Analytical Geochemistry Laboratories ( GeoPT ) organized by International Association of Geoanalysis ( IAG ) two times in a year.

Now XRF Lab of SAIF, Guwahati is preparing for NABL accreditation.

3) Single Crystal X-ray Diffractometer (SCD)

SAIF Guwahati is equipped with X-ray Diffractometer (Single Crystal). This was added to our analysis service in 2010. It has provided analytical services to the Scientists of N E region of India. .

The detailed specifications are:

Instrument: X-ray Diffractometer (Single Crystal)
Make/ Model: 8820222800 BRUKER AXS SMART APEX II
Major Specifications/ Accessories available :
FULLY AUTOMATED CHARGED COUPLE DEVICE
CCD DETECTOR BASED SINGLE CRYSTAL XRD WITH LOW TEMPERATURE (77K) ATTACHMENT.
3-CIRCLE GONIOMETER.

Type of measurement/analysis by SCD :
Determination of :

  • Unit cell parameters
  • Crystal system
  • Space group
  • Molecular structure

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Analysis Rates

Rates of Analysis for XRD ( in Rs ) [ Rate per sample ]

UserDiffractogramPhase Analysis Quantitative Analysis Particle Size Determination Lattice ParameteDetermination
Internal (GU) 150250 400 200 350
External 300 500 750 400 600
Industrial 990 1320 1650 1000 1400

Rates of Analysis for XRF (in Rs) [ Rate per sample ]

User Type10 Major & Minor Element OxidesLoss on Ignition(LOI)Each Trace Element
Non Academic & Industry 3,300210440
Academic ( GU) Teachers & Research Scholar1000100200
Students ( Up to 10 Samples)600100100
Academic (other) Teachers & Research1500200200
Students (Up to 10 Samples)1000200200

Rates of Qualitative XRF Analysis ( in Rs ) [ Rate per sample ]

Academic Internal ( GU ) : Rs. 500
Academic External : Rs. 700
Industrial User : Rs. 1,100

Rates of Pulverisation : Rs 50/- per sample

[12.36% SERVICE TAX EXTRA AS PER GOVT. DIRECTIVE]

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRD FORM

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRF FORM

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


GeoPT

Since 2000 SAIF Guwahati is regularly participating in the International Proficiency Test for Analytical Geochemistry Laboratories (GeoPT) organized by International Association of Geoanalysis ( IAG ) and till date 10 samples have been tested and reported so far by SAIF Guwahati.

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Click on the following links-

XRD

XRF

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


Sample Analysis Capabilities

XRD

XRD analysis of solid samples are routinely done in SAIF Guwahati..

Solid sample in the form of dry powder of about 300 mesh about 3 gm or sample on glass slide of size 2cm X 3.5cm and thickness 0.2 cm with uniform sample layer of size 2cm X 1.5cm on one side is required. XRD with less amount of sample or of users specific sample is also possible in special cases.

The output consists of Diffractogram, Peak positions, d values & relative intensities, Integrated Intensities, Peak Area & FWHM. Other analysis capabilities/services are

  • Phase Identification
  • Quantitative analysis of minerals present in the ICSD data base using X’Pert Plus software
  • Grazing incidence X-ray analysis of thin films
  • Partilce size measurement
  • Reflectivity measurement and film thickness analysis ( under development )
  • Microstrain and Stress analysis ( under development )
  • High Temperature ( upto 1600oC ) analysis of powder samples

XRF

Qualitative elemental analysis of solid samples, quantitative and trace element analysis of silicate rocks, cement, limestone samples are routinely done in the XRF.

Sample in the form of dry powder about 200 mesh, about 10gm is required for estimation of major and minor element oxides and qualitative analysis. Qualitative analysis may be possible with less amount of sample in some cases and in case of non-powder the sample should be in suitable form. For analysis of traces 20gm sample is required.

  • Qualitative Analysis
  • Quantitative Analysis

Qualitative Analysis : Qualitative elemental analysis are done for detection of elements present in the sample.

  • Detectable elemental range is from oxygen to uranium
  • Lower limit of detection (LLD) varies from element to element
  • Lower Limit of Detection (LLD) also depends upon nature and compositional matrix of the sample

Quantitative Analysis : Quantitative analysis of following types of samples are done

  • Silicate Rocks
  • Cement
  • Limestone

Quantitative analysis of silicate rocks for 10 major element oxides SiO2, Al2O3, Fe2O3(T), MnO, MgO, Na2O, CaO, K2O, TiO2, P2O5 and 32 Trace Elements Ag, As, Ba, Br, Cd, Ce, Co, Cr, Cs, Cu, Ga, La, Mn, Nb, Nd, Ni, Mo, Pb, Rb, S, Sb, Sc, Sn, Sm, Sr, Th, Tl, U, V, Y, Zn, Zr are being done on routine basis.

XRD

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRD

An Automated Powder X-ray Diffractometer ( XRD ) of Model APD 1700, Make Philips was installed in the year 1987 which after fifteen years of operation has become obsolete.

A fully Automated Computerised Powder X-ray Diffractometer ( XRD ) Model X’Pert Pro, Make PANalytical has been installed 2002 and is working.

The detailed specification are-
Model : X’Pert Pro
Make : Philips ( Now PANalytical )
X-ray Tube : Cu
Angular Range ( 2? ) : 1o to 167o
Programmable Divergence Slit
Programmable fixed slit with ¼ o, ½ o, 1o, 2o, 4o
High Temperature Attachment of range up to 1600o C
Thin Film Attachment
X’Pert software

  • Organiser
  • Data Collecter
  • Graphics & Identity
  • Stress and WinGIXA

ICDD database with PDF-1 & PDF2
ICSD Software

XRF

Sophisticated Analytical Instrument Facility (SAIF), Guwahati
(Sponsored by Dept. of Science & Technology, Govt. of India)


XRF

SAIF Guwahati is equipped with two numbers of working XRFs. The first one was installed in 1992 and the second one was installed in 2005. The detailed specifications are

First XRF :

Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installation : 1992
Model : PW1480
Make : Philips
X-ray Tube : Rh, Cr – Au
Elemental Range : Fluorine to Uranium
Analysing Crystals : LiF200, LiF220, TLAP, PE, GE, PX1, PX2
Detectors : Flow Proportional Counter & Scintillation Counter
Software : Philips X40UU software, Online Alpha Software
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

Second XRF :

Computerised Sequential X-ray Fluorescence Spectrometer ( XRF )
Installed in 2005
Model : AXIOS
Make : Philips ( Now PANalytical )
X-ray Tube : Rh
Elemental Range : Oxygen to Uranium
Analysing Crystal : LiF200, LiF220, GE, PE,PX1
Detectors : Flow proportional counter & scintillation
Software : SuperQ Software for qualitative and quantitative analysis
Pro Trace Software for trace element analysis
Analysis Method : Pressed Pallet Method, Fused Bead Method
Standard Reference Material : Silicate Rocks, Cements, Limestone

Staff

Utpal Sarma
MSc (Gauhati) PhD (Gauhati) Electronics
Kanak Chandra Sarma
MSc (Gauhati) PhD (Gauhati) Electronics
Debashis Saikia
MSc (Gauhati) Smart Sensor, Soft Computing, Sensor Network
Pradip Kumar Boruah (Retired Professor)
MSc (Gauhati) PhD (Gauhati) Electronics (Guest Faculty)
Pran Hari Talukdar
MSc (Gauhati) PhD (Gauhati) Electronics

Contact

The Head
Department of Instrumentation and USIC
Gauhati University
Guwahati- 781 014,Assam, INDIA
Phone No : +91-0361-2570560, 99540-48634
Email : Kanak_sarma50@rediffmail.com
Website : instrumentation.gauhati.ac.in 
                       
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